首頁(yè) >TPS7H2201MDAPTSEP>規(guī)格書(shū)列表
零件編號(hào) | 下載&訂購(gòu) | 功能描述 | 制造商&上傳企業(yè) | LOGO |
---|---|---|---|---|
TPS7H2201MDAPTSEP | TPS7H2201-SP and TPS7H2201-SEP Radiation Hardened 1.5-V to 7-V, 6-A eFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR) | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | |
TPS7H2211-SPRadiation-Hardness-Assured(RHA)14-V,3.5-AeFuse 1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy | TITexas Instruments 德州儀器美國(guó)德州儀器公司 | TI | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5-Vto7-V,6-AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR) | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5Vto7V,6AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)i | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPRadiationHardened1.5-Vto7-V,6-ALoadSwitch 1Features 1?Radiationperformance: –Radiationhardnessassurance(RHA)upto TID100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)immunetoLET=75MeV-cm2/mg –SEFI/SETcharacterizedto LET=75MeV-cm2/mg ?Integratedsingle | TITexas Instruments 德州儀器美國(guó)德州儀器公司 | TI | ||
TPS7H2211-SPRadiation-Hardness-Assured(RHA)14-V,3.5-AeFuse 1Features ?Totalionizingdose(TID)characterizedto100 krad(Si) –Radiationhardnessassuranceavailabilityof 100krad(Si) ?Single-eventeffects(SEE)characterized –Single-eventlatchup(SEL),single-event burnout(SEB),andsingle-eventgaterupture (SEGR)immunetolinearenergy | TITexas Instruments 德州儀器美國(guó)德州儀器公司 | TI | ||
RadiationHardened1.5-Vto7-V,6-ALoadSwitch | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
RadiationHardened1.5-Vto7-V,6-ALoadSwitch | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
RadiationHardened1.5-Vto7-V,6-ALoadSwitch | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5-Vto7-V,6-AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR) | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5Vto7V,6AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)i | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5Vto7V,6AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)i | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPandTPS7H2201-SEPRadiationHardened1.5-Vto7-V,6-AeFuse 1Features ?Standardmicrocircuitavailable,SMD 5962R17220 ?Vendoritemdrawingavailable,VIDV62/23608 ?Radiationperformance: –Radiationhardnessassurance(RHA)uptoTID 100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR) | TI1Texas Instruments(TI) 德州儀器德州儀器 (TI) | TI1 | ||
TPS7H2201-SPRadiationHardened1.5-Vto7-V,6-ALoadSwitch 1Features 1?Radiationperformance: –Radiationhardnessassurance(RHA)upto TID100krad(Si) –Singleeventlatchup(SEL),singleevent burnout(SEB),andsingleeventgaterupture (SEGR)immunetoLET=75MeV-cm2/mg –SEFI/SETcharacterizedto LET=75MeV-cm2/mg ?Integratedsingle | TITexas Instruments 德州儀器美國(guó)德州儀器公司 | TI |
供應(yīng)商 | 型號(hào) | 品牌 | 批號(hào) | 封裝 | 庫(kù)存 | 備注 | 價(jià)格 |
---|---|---|---|---|---|---|---|
Texas Instruments |
23+/24+ |
32-TSSOP |
8600 |
只供原裝進(jìn)口公司現(xiàn)貨+可訂貨 |
詢(xún)價(jià) | ||
TI德州儀器 |
22+ |
24000 |
原裝正品現(xiàn)貨,實(shí)單可談,量大價(jià)優(yōu) |
詢(xún)價(jià) | |||
N/A |
99 |
詢(xún)價(jià) | |||||
TI |
22+ |
(KGD) |
6000 |
原廠(chǎng)原裝,價(jià)格優(yōu)勢(shì)!13246658303 |
詢(xún)價(jià) | ||
TI/德州儀器 |
23+ |
XCEPT |
8355 |
只做原裝現(xiàn)貨/實(shí)單可談/支持含稅拆樣 |
詢(xún)價(jià) | ||
24+ |
N/A |
47000 |
一級(jí)代理-主營(yíng)優(yōu)勢(shì)-實(shí)惠價(jià)格-不悔選擇 |
詢(xún)價(jià) | |||
TI |
23+ |
CFP-16 |
5000 |
全新原裝正品現(xiàn)貨 |
詢(xún)價(jià) | ||
TI |
22+ |
NA |
500000 |
萬(wàn)三科技,秉承原裝,購(gòu)芯無(wú)憂(yōu) |
詢(xún)價(jià) | ||
TI |
16+ |
原廠(chǎng)封裝 |
29 |
宇航IC只做原裝假一罰十 |
詢(xún)價(jià) | ||
TI |
24+ |
N/A |
90000 |
原廠(chǎng)正規(guī)渠道現(xiàn)貨、保證原裝正品價(jià)格合理 |
詢(xún)價(jià) |
相關(guān)規(guī)格書(shū)
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- TPS7H2201-SP
- TPS7H2201-SP
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相關(guān)庫(kù)存
更多- TPS7H2201-SEP
- TPS7H2201-SP
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- TPS7H4001-SP
- TPS7H4001-SP_V02
- TPS7H4001-SP_V04
- TPS7H4001Y/EM
- TPS7H4002HKH/EM
- TPS7H4002HKH/EM
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