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TSMU818A030AMO中文資料德州儀器數(shù)據(jù)手冊(cè)PDF規(guī)格書

TSMU818A030AMO
廠商型號(hào)

TSMU818A030AMO

功能描述

TSMU818A030 8-Channel, 18-Bit, 30V, 100mA Output, High-Capacitive Drive Parametric Measurement Unit (PMU)

絲印標(biāo)識(shí)

TSMU818A030

封裝外殼

FCBGA

文件大小

476.61 Kbytes

頁面數(shù)量

6

生產(chǎn)廠商 Texas Instruments
企業(yè)簡(jiǎn)稱

TI德州儀器

中文名稱

美國德州儀器公司官網(wǎng)

原廠標(biāo)識(shí)
數(shù)據(jù)手冊(cè)

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更新時(shí)間

2025-3-6 22:59:00

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TSMU818A030AMO規(guī)格書詳情

1 Features

? 8-channel 4-quadrant PMU

– FV, FI, FZ (high-Z), MV, and MI functions

? Programmable current ranges

– Internal ±5μA, ±40μA, ±200μA, ±2mA ranges

– Up to ±100mA with external RSENSE

? 30V FV span with asymmetrical range choices

? Stable operation with up to 10μF CLOAD

? Channel independent DACs

– 18-bit force DAC with multiple voltage ranges

– 16-bit offset, and voltage clamp DACs

– 15-bit current clamp DACs

? Offset error and gain error calibration with true 18-

bit endpoint performance

? Dual configuration state digital architecture

? Fast current clamps

2 Applications

? Memory test

? Semiconductor test

? Source measurement units

3 Description

The TSMU818A030 is a high-performance, highly

integrated parametric measurement unit (PMU)

consisting of eight independent channels. Each

channel includes one voltage output DAC that sets

the programmable input levels for the force voltage

amplifier and two clamp input DACs. Five resistor

based programmable force and measure current

ranges are available, ranging from ±5μA to ±100mA.

Four of these ranges use on-chip sense resistors.

Measurements for the eight channels can be

multiplexed in a wired-or configuration, which

eliminates the need for an external multiplexer.

Individual measurement outputs for respective

channels are also available. The PMU functions

are controlled using a simple SPI-compatible serial

interface. Interface clock of 80MHz allows for fast

mode updates and state changes with the dual-state

double-buffered architecture. Configuration registers

allow the user to easily change force or measure

conditions, DAC levels, and selected current ranges.

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