ISL73419SEHVF中文資料瑞薩數(shù)據(jù)手冊PDF規(guī)格書

Features

? Electrically screened to DLA SMD# 5962-14226

? Low input offset voltage. . . . . . . . . . . . . . . . . . . ±110μV, Max.

? Superb offset temperature coefficient. . . . . . . 1μV/°C, Max.

? Input bias current . . . . . . . . . . . . . . . . . . . . . . . . . ±15nA, Max.

? Input bias current TC . . . . . . . . . . . . . . . . . . . . ±5pA/°C, Max.

? Low current consumption . . . . . . . . . . . . . . . . . . . . . . . 440μA

? Voltage noise . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8nV/?Hz

? Wide supply range . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 36V

? Operating temperature range. . . . . . . . . . . .-55°C to +125°C

? ISL70419SEH radiation acceptance testing

- High dose rate (50-300rad(Si)/s): 300krad(Si)

- Low dose rate (10mrad(Si)/s): 50krad(Si)

? ISL73419SEH radiation acceptance testing

- Low dose rate (10mrad(Si)/s): 50krad(Si)

? SEE hardness (see SEE report for details)

- SEL/SEB LETTH (VS = ±18V): 86.4MeV?cm2/mg