3535中文資料ASM-SENSOR數(shù)據(jù)手冊PDF規(guī)格書

LCR HiTESTER

Measure across the broad frequency range of 100kHz to 120MHz with the new Model 3535 LCR HiTESTER. The 6ms highspeed measurement capability is particularly useful with the builtin comparator and load functions, and for BIN (classification) measurements, to suit a wide range of applications such as chip inductor and high speed magnetic head testing, as well as other related research needs. Achieve ultimate measurement flexibility by detaching the head amp unit from the main unit and placing it in proximity to the test object so as to minimize the effect of test leads on measurements. The 3535s low price, ideal size and light weight are all achieved by incorporating an automatically balanced bridge circuit with digital control. Never before has such an advanced precision instrument coupled with economical features been placed on the test and measurement market.